Conference Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials (1995 : Reno, Nevada)

Title Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Materials and the twenty-second State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXII) / edited by V. Swaminathan...[et al.].

Imprint Pennington, NJ : Electrochemical Society, c1995.
Location Call Number Status
 Monograph Collection  TK7871.99.C65 S98 1995  AVAILABLE
Description ix, 378 p.: ill.: 23 cm.
Series Proceedings (Electrochemical Society) ; v. 95-6.
Note Held at the Spring Meeting of The Electrochemical Society, Inc. May 21-26, 1995, Reno, Nevada.
"Electronics and Dielectric Science and Technology Divisions."
Bibliography Includes bibliographical references and indexes.
Subject(s) Compound semiconductors -- Design and construction -- Congresses.
Semiconductor wafers -- Congresses.
Alternate Author Swaminathan, V.
Electrochemical Society. Electronics Division.
Electrochemical Society. Dielectric Science and Technology Division.
State-of-the-Art Program on Compound Semiconductors (22nd : 1995: Reno, Nevada)
Cover Title Nondestructive wafer characterization for compound materials
Twenty-second state-of-the-art program on compound semiconductors (SOTAPOCS XXII)
22nd state-of-the-art program on compound semiconductors (SOTAPOCS XXII)
Compound semiconductors (SOTAPOCS XXII)
Additional Title SOTAPOCS
SOTAPOCS XXII